To.Sca.Lab – Laboratory for Scattering and Complex Systems

Contacts

Fabio Ferrifabio.ferri@uninsubria.it | Tel.: +39 031 238 6253
Alberto Parolaalberto.parola@uninsubria.it | Tel.: +39 031 238 6252
Pietro Anzinipietro.anzini@uninsubria.it | Tel.: +39 031 238 6252

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Research Focus

To.Sca.Lab, founded jointly in 2012 by the University of Insubria and the CNR’s Institute of Crystallography, integrates experimental and computational expertise in chemistry, crystallography, and physics.

Its core research revolves around scattering techniques—from X-rays to visible light—to reconstruct the structural, microstructural, and dynamic behavior of nanocrystalline, partially ordered, and disordered materials across scales, from atomic resolution up to the millimeter range.

Complementing experimental studies, the lab develops theoretical models and numerical simulations. It focuses on complex fluids and colloidal systems, particularly their response to thermal gradients under spatial confinement, with applications in microfluidics.

To.Sca.Lab is active in both fundamental and applied research and regularly organizes advanced training seminars and Summer Schools. The lab fosters a dynamic, collaborative environment with strong national and international partnerships.

Laboratories

  • To.Sca.Lab (3rd Floor, Via Valleggio 11, Como)
  • Light Scattering Laboratory (3rd Floor, Via Valleggio 11, Como)

Equipment and Facilities

The lab specializes in developing and applying advanced light scattering techniques for characterizing nano- and micro-scale particles in solution. Facilities include:

  • Instruments for Static Light Scattering (SLS) and Dynamic Light Scattering (DLS), covering angular ranges of ~0.1–170 degrees, enabling granulometric analysis of particles from ~5 nm to ~100 microns using in-house software and inversion algorithms.
  • Optical setups for:
    • Traditional and ghost imaging
    • Absorbance and fluorescence measurements of colloidal solutions
    • Interferometric microscopy for surface and thin-film characterization
    • Speckle interferometry for surface roughness analysis.

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